Structural and Chemical Analysis of Materials: X-Ray, Electron and Neutron Diffraction; X-Ray, Electron and Ion Spectrometry; Electron Microscopy
Jean Pierre Eberhart
576 pages, Hardcover
ISBN: 0471929778
ISBN13:
Language: English
Publish: August 15, 1991
An extraordinary development in techniques for studying and testing materials has occurred in recent years. Provides a basic knowledge of these material analysis methods. It is a comprehensive and coherent survey of the theory and practice of the most important of these techniques based on X-ray, electron and ion spectrometry, on the various imaging methods and electron microscopies, including scanning tunneling microscopy.