Structural and Chemical Analysis of Materials: X-Ray, Electron and Neutron Diffraction; X-Ray, Electron and Ion Spectrometry; Electron Microscopy

Jean Pierre Eberhart

576 pages, Hardcover

ISBN: 0471929778

ISBN13:

Language: English

Publish: August 15, 1991

An extraordinary development in techniques for studying and testing materials has occurred in recent years. Provides a basic knowledge of these material analysis methods. It is a comprehensive and coherent survey of the theory and practice of the most important of these techniques based on X-ray, electron and ion spectrometry, on the various imaging methods and electron microscopies, including scanning tunneling microscopy.

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